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Co-authors
- Susumu OkadaUniversity of TsukubaVerified email at comas-tsukuba.jp
- Osamu SuginoUniversity of TokyoVerified email at issp.u-tokyo.ac.jp
- Nguyen Thanh CuongSamsung Electronics, Principal EngineerVerified email at samsung.com
- Yumin QianBeijing Institute of technologyVerified email at bit.edu.cn
- Ikutaro HamadaDepartment of Precision Engineering, Graduate School of Engineering, Osaka UniversityVerified email at prec.eng.osaka-u.ac.jp
- Brandon C. WoodLEAF Director, Lawrence Livermore National LaboratoryVerified email at llnl.gov
- Yoshitada MorikawaProfessor of Osaka UniversityVerified email at prec.eng.osaka-u.ac.jp
- Atsuo YamadaThe University of TokyoVerified email at chemsys.t.u-tokyo.ac.jp
- Tadashi OgitsuLawrence Livermore National LaboratoryVerified email at llnl.gov
- Masashi OKUBO, 大久保將史Waseda University, 早稲田大学先進理工学部Verified email at waseda.jp
- Tuan Anh PhamLawrence Livermore National LabVerified email at llnl.gov
- Kenji Shiraishi名古屋大学 未来材料・システム研究所Verified email at imass.nagoya-u.ac.jp
- Taisuke OzakiProfessor, ISSP, University of TokyoVerified email at issp.u-tokyo.ac.jp
- Monika BienerLLNLVerified email at llnl.gov
- Akira SugaharaThe univertsity of TokyoVerified email at battery.t.u-tokyo.ac.jp
- Stephen E. WeitznerLawrence Livermore National LaboratoryVerified email at llnl.gov
- Joel B VarleyLawrence Livermore National LaboratoryVerified email at llnl.gov
- Kazu SuenagaOsaka UniversityVerified email at sanken.osaka-u.ac.jp
- SOKRATES T. PANTELIDESProfessor of Physics, Vanderbilt UniversityVerified email at vanderbilt.edu
- Mikito KoshinoDepartment of Physics, Osaka UniversityVerified email at phys.sci.osaka-u.ac.jp