John C. Bean

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Leonard FeldmanProfessor of Physics and Materials ScienceVerified email at rutgers.edu
J. Murray GibsonProfessor of Mechanical EngineeringVerified email at eng.famu.fsu.edu
T.P. PearsallEPICVerified email at ieee.org
Raymond T. TungBrooklyn College, Bell LabsVerified email at brooklyn.cuny.edu
Joe CampbellProfessor Electrical and Computer Engineering, University of VirginiaVerified email at virginia.edu
Ian RobinsonBrookhaven LabVerified email at ucl.ac.uk
Abbas OurmazdDistinguished Professor of PhysicsVerified email at uwm.edu
Serge LuryiDistinguished Professor of Electrical Engineering, Stony Brook UniversityVerified email at stonybrook.edu
Colin HumphreysQueen Mary University of LondonVerified email at qmul.ac.uk
James M. TourProfessor, Rice University, Department of Chemistry, Materials Science and NanoEngineering, andVerified email at rice.edu
eric p kvamProfessor, Materials Engineering, Purdue UniversityVerified email at purdue.edu
Thomas VanderveldeTufts UniversityVerified email at ece.tufts.edu
George K CellerProfessor of Materials Science, Rutgers UniversityVerified email at rci.rutgers.edu
Anders OlssonPearl LaboratoriesVerified email at pearllaboratories.com
Rudolf TrompIBM T.J. Watson Research Center / Leiden UniversityVerified email at us.ibm.com
Mark S HybertsenSenior Physicist, Emeritus, Center for Functional Nanomaterials, Brookhaven National LaboratoryVerified email at bnl.gov
Mircea R. StanVirginia Microelectronics Consortium (VMEC) Professor, University of VirginiaVerified email at virginia.edu
Jerry TersoffIBMVerified email at us.ibm.com
Nathan SwamiProfessor, University of Virginia, Charlottesville, VAVerified email at virginia.edu
Garrett S. RoseProfessor, University of TennesseeVerified email at utk.edu

John C. Bean

Stanford University OR Bell Labs OR University of Virginia OR WeCanFigureThisOut.org

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Semiconductor nanostructures MBE SiGe Sustainable Energy Education


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Magnetization of hard superconductors CP Bean Physical review letters 8 (6), 250, 1962	5593	1962
Calculation of critical layer thickness versus lattice mismatch for Ge_xSi_1−x/Si strained‐layer heterostructures R People, JC Bean Applied Physics Letters 47 (3), 322-324, 1985	2464	1985
Ge_xSi_1−x/Si strained‐layer superlattice grown by molecular beam epitaxy JC Bean, LC Feldman, AT Fiory, S Nakahara, IK Robinson Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 2 (2 …, 1984	1012	1984
Band alignments of coherently strained Ge_xSi_1−x/Si heterostructures on <001> Ge_ySi_1−y substrates R People, JC Bean Applied physics letters 48 (8), 538-540, 1986	464	1986
Measurement of the band gap of GexSi1− x/Si strained‐layer heterostructures DV Lang, R People, JC Bean, AM Sergent Applied Physics Letters 47 (12), 1333-1335, 1985	447	1985
Modulation doping in Ge_xSi_1−x/Si strained layer heterostructures R People, JC Bean, DV Lang, AM Sergent, HL Störmer, KW Wecht, ... Applied Physics Letters 45 (11), 1231-1233, 1984	398	1984
Silicon-based semiconductor heterostructures: column IV bandgap engineering JC Bean Proceedings of the IEEE 80 (4), 571-587, 1992	355	1992
Picosecond optoelectronic detection, sampling, and correlation measurements in amorphous semiconductors DH Auston, AM Johnson, PR Smith, JC Bean Applied Physics Letters 37 (4), 371-373, 1980	348	1980
Observation of order-disorder transitions in strained-semiconductor systems A Ourmazd, JC Bean Physical review letters 55 (7), 765, 1985	312	1985
Pseudomorphic growth of Ge_xSi₁₋_x on silicon by molecular beam epitaxy JC Bean, TT Sheng, LC Feldman, AT Fiory, RT Lynch Applied Physics Letters 44 (1), 102-104, 1984	309	1984
Stress-induced self-organization of nanoscale structures in SiGe/Si multilayer films C Teichert, MG Lagally, LJ Peticolas, JC Bean, J Tersoff Physical Review B 53 (24), 16334, 1996	302	1996
Raman scattering from Ge_xSi_1−x/Si strained‐layer superlattices F Cerdeira, A Pinczuk, JC Bean, B Batlogg, BA Wilson Applied physics letters 45 (10), 1138-1140, 1984	292	1984
Misfit dislocations in lattice-mismatched epitaxial films R Hull, JC Bean Critical Reviews in Solid State and Material Sciences 17 (6), 507-546, 1992	290	1992
GexSi1− x strained‐layer superlattice waveguide photodetectors operating near 1.3 μm H Temkin, TP Pearsall, JC Bean, RA Logan, S Luryi Applied Physics Letters 48 (15), 963-965, 1986	290	1986
Epitaxial silicides RT Tung, JM Poate, JC Bean, JM Gibson, DC Jacobson Thin Solid Films 93 (1-2), 77-90, 1982	260	1982
New infrared detector on a silicon chip S Luryi, A Kastalsky, JC Bean IEEE Transactions on Electron Devices 31 (9), 1135-1139, 1984	242	1984
Dependence of residual damage on temperature during Ar+ sputter cleaning of silicon JC Bean, GE Becker, PM Petroff, TE Seidel Journal of Applied Physics 48 (3), 907-913, 1977	241	1977
Growth of single‐crystal CoSi₂ on Si(111) RT Tung, JC Bean, JM Gibson, JM Poate, DC Jacobson Applied Physics Letters 40 (8), 684-686, 1982	238	1982
Stability of semiconductor strained‐layer superlattices R Hull, JC Bean, F Cerdeira, AT Fiory, JM Gibson Applied physics letters 48 (1), 56-58, 1986	202	1986
Dislocation nucleation near the critical thickness in GeSi/Si strained layers DJ Eaglesham, EP Kvam, DM Maher, CJ Humphreys, JC Bean Philosophical Magazine A 59 (5), 1059-1073, 1989	198	1989

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