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Edward SargentNorthwestern University & University of TorontoVerified email at northwestern.edu- Dirk BouwmeesterUniversity of California Santa Barbara & Leiden UniversityVerified email at ucsb.edu
- Sjoerd HooglandDepartment of Electrical and Computer Engineering, University of TorontoVerified email at utoronto.ca
- Alexander H. IpCERT SystemsVerified email at utoronto.ca
- Andre J LabelleElectrical and Computer Engineering, University of TorontoVerified email at mail.utoronto.ca
- Pierre PetroffVerified email at ucsb.edu
- Oleksandr VoznyyAssociate Professor at University of TorontoVerified email at utoronto.ca
- Hyochul KimSamsung Advanced Institute of TechnologyVerified email at samsung.com
- Graham H. CareyPhD student, University of TorontoVerified email at mail.utoronto.ca
- Illan KramerUniversity of TorontoVerified email at utoronto.ca
- Ebuka S. ArinzeJohns Hopkins University, Electrical and Computer EngineeringVerified email at jhu.edu
- David ZhitomirskyMITVerified email at mit.edu
- Ratan DebnathNational Institute of Standards and Technology (NIST), Gaithersburg, USAVerified email at nist.gov
- Aram AmassianProfessor of Materials Science and Engineering, North Carolina State UniversityVerified email at ncsu.edu
- Botong QiuJohns Hopkins UniversityVerified email at jhu.edu
- Kang Wei ChouHenkelVerified email at henkel.com
- Yida LinThe Johns Hopkins UniversitVerified email at jhu.edu
- Yan ChengJohns Hopkins UniversityVerified email at jhu.edu
- Arlene ChiuJohns Hopkins University, Electrical and Computer EngineeringVerified email at jhu.edu
- Osman BakrProfessor, Materials Science & Eng., King Abdullah University of Science and Technology (KAUST)Verified email at kaust.edu.sa
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Susanna Thon
Johns Hopkins University, Electrical and Computer Engineering
Verified email at jhu.edu - Homepage