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Klaus van Benthem
Klaus van Benthem
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Title
Cited by
Cited by
Year
Bulk electronic structure of Experiment and theory
K Van Benthem, C Elsässer, RH French
Journal of applied physics 90 (12), 6156-6164, 2001
11752001
Materials characterization in the aberration-corrected scanning transmission electron microscope
M Varela, AR Lupini, K Benthem, AY Borisevich, MF Chisholm, N Shibata, ...
Annu. Rev. Mater. Res. 35 (1), 539-569, 2005
2932005
Three-dimensional imaging of individual hafnium atoms inside a semiconductor device
K van Benthem, AR Lupini, M Kim, HS Baik, SJ Doh, JH Lee, MP Oxley, ...
Applied Physics Letters 87 (3), 2005
2892005
The effect of interfacial layer properties on the performance of Hf-based gate stack devices
G Bersuker, CS Park, J Barnett, PS Lysaght, PD Kirsch, CD Young, ...
Journal of Applied Physics 100 (9), 2006
1962006
Amorphous alumina nanoparticles: structure, surface energy, and thermodynamic phase stability
AH Tavakoli, PS Maram, SJ Widgeon, J Rufner, K Van Benthem, ...
The Journal of Physical Chemistry C 117 (33), 17123-17130, 2013
1772013
Point defect configurations of supersaturated Au atoms inside Si nanowires
SH Oh, K Benthem, SI Molina, AY Borisevich, W Luo, P Werner, ...
Nano letters 8 (4), 1016-1019, 2008
1632008
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy
K van Benthem, AR Lupini, MP Oxley, SD Findlay, LJ Allen, ...
Ultramicroscopy 106 (11-12), 1062-1068, 2006
1592006
Sintering: mechanisms of convention nanodensification and field assisted processes
R Castro, K Van Benthem
Springer Science & Business Media, 2012
1522012
Dopant segregation and giant magnetoresistance in manganese-doped germanium
AP Li, C Zeng, K van Benthem, MF Chisholm, J Shen, ...
Physical Review B—Condensed Matter and Materials Physics 75 (20), 201201, 2007
1272007
Electrode effects on microstructure formation during flash sintering of yttrium‐stabilized zirconia
W Qin, H Majidi, J Yun, K van Benthem
Journal of the American Ceramic Society 99 (7), 2253-2259, 2016
1222016
Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems
SJ Pennycook, MF Chisholm, AR Lupini, M Varela, AY Borisevich, ...
Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009
1172009
Au on MgAl2O4 spinels: The effect of support surface properties in glycerol oxidation
A Villa, A Gaiassi, I Rossetti, CL Bianchi, K van Benthem, GM Veith, ...
Journal of Catalysis 275 (1), 108-116, 2010
1132010
Single Pd atoms in activated carbon fibers and their contribution to hydrogen storage
CI Contescu, K Van Benthem, S Li, CS Bonifacio, SJ Pennycook, P Jena, ...
Carbon 49 (12), 4050-4058, 2011
902011
Optimal doping control of magnetic semiconductors via subsurfactant epitaxy
C Zeng, Z Zhang, K Van Benthem, MF Chisholm, HH Weitering
Physical Review Letters 100 (6), 066101, 2008
872008
Si/SiO2 and SiC/SiO2 Interfaces for MOSFETs – Challenges and Advances
ST Pantelides, S Wang, A Franceschetti, R Buczko, M Di Ventra, ...
Materials science forum 527, 935-948, 2006
872006
Metal/ceramic interface structures and segregation behavior in aluminum-based composites
X Zhang, T Hu, JF Rufner, TB LaGrange, GH Campbell, EJ Lavernia, ...
Acta materialia 95, 254-263, 2015
852015
Interpreting atomic-resolution spectroscopic images
MP Oxley, M Varela, TJ Pennycook, K van Benthem, SD Findlay, ...
Physical Review B—Condensed Matter and Materials Physics 76 (6), 064303, 2007
812007
Scanning transmission electron microscopy for nanostructure characterization
SJ Pennycook, AR Lupini, M Varela, A Borisevich, Y Peng, MP Oxley, ...
Scanning microscopy for nanotechnology: techniques and applications, 152-191, 2007
812007
Evidence of surface cleaning during electric field assisted sintering
CS Bonifacio, TB Holland, K van Benthem
Scripta Materialia 69 (11-12), 769-772, 2013
752013
Valence electron energy loss study of Fe-doped SrTiO3 and a Σ13 boundary: electronic structure and dispersion forces
K Van Benthem, RH French, W Sigle, C Elsässer, M Rühle
Ultramicroscopy 86 (3-4), 303-318, 2001
752001
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