Bulk electronic structure of Experiment and theory K Van Benthem, C Elsässer, RH French Journal of applied physics 90 (12), 6156-6164, 2001 | 1175 | 2001 |
Materials characterization in the aberration-corrected scanning transmission electron microscope M Varela, AR Lupini, K Benthem, AY Borisevich, MF Chisholm, N Shibata, ... Annu. Rev. Mater. Res. 35 (1), 539-569, 2005 | 293 | 2005 |
Three-dimensional imaging of individual hafnium atoms inside a semiconductor device K van Benthem, AR Lupini, M Kim, HS Baik, SJ Doh, JH Lee, MP Oxley, ... Applied Physics Letters 87 (3), 2005 | 289 | 2005 |
The effect of interfacial layer properties on the performance of Hf-based gate stack devices G Bersuker, CS Park, J Barnett, PS Lysaght, PD Kirsch, CD Young, ... Journal of Applied Physics 100 (9), 2006 | 196 | 2006 |
Amorphous alumina nanoparticles: structure, surface energy, and thermodynamic phase stability AH Tavakoli, PS Maram, SJ Widgeon, J Rufner, K Van Benthem, ... The Journal of Physical Chemistry C 117 (33), 17123-17130, 2013 | 177 | 2013 |
Point defect configurations of supersaturated Au atoms inside Si nanowires SH Oh, K Benthem, SI Molina, AY Borisevich, W Luo, P Werner, ... Nano letters 8 (4), 1016-1019, 2008 | 163 | 2008 |
Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy K van Benthem, AR Lupini, MP Oxley, SD Findlay, LJ Allen, ... Ultramicroscopy 106 (11-12), 1062-1068, 2006 | 159 | 2006 |
Sintering: mechanisms of convention nanodensification and field assisted processes R Castro, K Van Benthem Springer Science & Business Media, 2012 | 152 | 2012 |
Dopant segregation and giant magnetoresistance in manganese-doped germanium AP Li, C Zeng, K van Benthem, MF Chisholm, J Shen, ... Physical Review B—Condensed Matter and Materials Physics 75 (20), 201201, 2007 | 127 | 2007 |
Electrode effects on microstructure formation during flash sintering of yttrium‐stabilized zirconia W Qin, H Majidi, J Yun, K van Benthem Journal of the American Ceramic Society 99 (7), 2253-2259, 2016 | 122 | 2016 |
Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems SJ Pennycook, MF Chisholm, AR Lupini, M Varela, AY Borisevich, ... Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009 | 117 | 2009 |
Au on MgAl2O4 spinels: The effect of support surface properties in glycerol oxidation A Villa, A Gaiassi, I Rossetti, CL Bianchi, K van Benthem, GM Veith, ... Journal of Catalysis 275 (1), 108-116, 2010 | 113 | 2010 |
Single Pd atoms in activated carbon fibers and their contribution to hydrogen storage CI Contescu, K Van Benthem, S Li, CS Bonifacio, SJ Pennycook, P Jena, ... Carbon 49 (12), 4050-4058, 2011 | 90 | 2011 |
Optimal doping control of magnetic semiconductors via subsurfactant epitaxy C Zeng, Z Zhang, K Van Benthem, MF Chisholm, HH Weitering Physical Review Letters 100 (6), 066101, 2008 | 87 | 2008 |
Si/SiO2 and SiC/SiO2 Interfaces for MOSFETs – Challenges and Advances ST Pantelides, S Wang, A Franceschetti, R Buczko, M Di Ventra, ... Materials science forum 527, 935-948, 2006 | 87 | 2006 |
Metal/ceramic interface structures and segregation behavior in aluminum-based composites X Zhang, T Hu, JF Rufner, TB LaGrange, GH Campbell, EJ Lavernia, ... Acta materialia 95, 254-263, 2015 | 85 | 2015 |
Interpreting atomic-resolution spectroscopic images MP Oxley, M Varela, TJ Pennycook, K van Benthem, SD Findlay, ... Physical Review B—Condensed Matter and Materials Physics 76 (6), 064303, 2007 | 81 | 2007 |
Scanning transmission electron microscopy for nanostructure characterization SJ Pennycook, AR Lupini, M Varela, A Borisevich, Y Peng, MP Oxley, ... Scanning microscopy for nanotechnology: techniques and applications, 152-191, 2007 | 81 | 2007 |
Evidence of surface cleaning during electric field assisted sintering CS Bonifacio, TB Holland, K van Benthem Scripta Materialia 69 (11-12), 769-772, 2013 | 75 | 2013 |
Valence electron energy loss study of Fe-doped SrTiO3 and a Σ13 boundary: electronic structure and dispersion forces K Van Benthem, RH French, W Sigle, C Elsässer, M Rühle Ultramicroscopy 86 (3-4), 303-318, 2001 | 75 | 2001 |