| Failure modes and mechanisms of DC‐aged GaN LEDs G Meneghesso, S Levada, E Zanoni, S Podda, G Mura, M Vanzi, ... physica status solidi (a) 194 (2), 389-392, 2002 | 84 | 2002 |
| Reliability of visible GaN LEDs in plastic package G Meneghesso, S Levada, E Zanoni, G Scamarcio, G Mura, E Zanoni, ... Microelectronics Reliability 43, 1737-1742, 2003 | 74 | 2003 |
| High brightness GaN LEDs degradation during dc and pulsed stress M Meneghini, S Podda, A Morelli, R Pintus, L Trevisanello, ... Microelectronics Reliability 46 (9-11), 1720-1724, 2006 | 73 | 2006 |
| Microscopic biomineralization processes and Zn bioavailability: a synchrotron-based investigation of Pistacia lentiscus L. roots G De Giudici, D Medas, C Meneghini, MA Casu, A Gianoncelli, A Iadecola, ... Environmental Science and Pollution Research 22, 19352-19361, 2015 | 35 | 2015 |
| An automatic alignment procedure for a four-source photometric stereo technique applied to scanning electron microscopy R Pintus, S Podda, M Vanzi IEEE Transactions on Instrumentation and Measurement 57 (5), 989-996, 2008 | 34 | 2008 |
| Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions M Meneghini, L Trevisanello, S Podda, S Buso, G Spiazzi, G Meneghesso, ... Sixth International Conference on Solid State Lighting 6337, 134-141, 2006 | 30 | 2006 |
| Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs G Meneghesso, E Zanoni, M Vanzi Microelectronics reliability 41, 1609-1614, 2001 | 25 | 2001 |
| Accelerated carbonation by cement kiln dust in aqueous slurries: chemical and mineralogical investigation D Medas, G Cappai, G De Giudici, M Piredda, S Podda Greenhouse Gases: Science and Technology 7 (4), 692-705, 2017 | 24 | 2017 |
| ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology L Sponton, L Cerati, G Croce, G Mura, S Podda, M Vanzi, G Meneghesso microelectronics reliability 42, 1303-1306, 2002 | 17 | 2002 |
| High brightness InGaN LEDs degradation at high injection current bias S Levada, M Meneghini, E Zanoni, S Buso, G Spiazzi, G Meneghesso, ... 2006 IEEE International Reliability Physics Symposium Proceedings, 615-616, 2006 | 15 | 2006 |
| Quantitative 3D reconstruction from BS imaging. R Pintus, S Podda, F Mighela, M Vanzi Microelectron. Reliab. 44 (9-11), 1547-1552, 2004 | 11 | 2004 |
| CyTest–an innovative open-source platform for training and testing in cythopathology L Lianas, ME Piras, E Musu, S Podda, F Frexia, E Ovcin, G Bussolati, ... Procedia-Social and Behavioral Sciences 228, 674-681, 2016 | 8 | 2016 |
| Image alignment for 3D reconstruction in a SEM R Pintus, S Podda, M Vanzi Microelectronics Reliability 45 (9-11), 1581-1584, 2005 | 7 | 2005 |
| XEBIC at the Dual Beam M Vanzi, S Podda, E Musu, R Cao Microelectronics Reliability 53 (9-11), 1399-1402, 2013 | 4 | 2013 |
| Improvements in automated photometric stereo 3D SEM R Pintus, S Podda, M Vanzi Microscopy and Microanalysis 14 (S2), 608-609, 2008 | 3 | 2008 |
| 3D Sculptures From SEM Images R Pintus, S Podda, M Vanzi EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen …, 2008 | 2 | 2008 |
| Failure analysis of RuO2 thick film chip resistors S Podda, G Cassanelli, F Fantini, M Vanzi Microelectronics Reliability 44 (9-11), 1763-1767, 2004 | 2 | 2004 |
| Backside failure analysis of GaAs ICs after ESD tests G Meneghesso, A Cocco, G Mura, S Podda, M Vanzi Microelectronics Reliability 42 (9-11), 1293-1298, 2002 | 2 | 2002 |
| Cy-TEST-A new platform for training and testing in cytopathology L Lianas, ME Piras, E Musu, S Podda, F Frexia, E Ovcin, G Bussolati, ... Diagnostic Pathology 2 (1), 2016 | 1 | 2016 |
| Implementation of TV-rate EBIC at a Dual BEam M Vanzi, S Podda, F Tatti Proceedings of 10 Multinational Congress on Microscopy 2011, 71-72, 2011 | 1 | 2011 |
