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Portavoce
Portavoce
CNRS-IM2NP
Verified email at im2np.fr
Title
Cited by
Cited by
Year
SiGe nanostructures: new insights into growth processes
I Berbezier, A Ronda, A Portavoce
Journal of Physics: Condensed Matter 14 (35), 8283, 2002
902002
Sb-surfactant-mediated growth of Si and Ge nanostructures
A Portavoce, I Berbezier, A Ronda
Physical Review B 69 (15), 155416, 2004
782004
Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si (001) surfaces
A Portavoce, M Kammler, R Hull, MC Reuter, FM Ross
Nanotechnology 17 (17), 4451, 2006
672006
Grain-boundary segregation of boron in high-strength steel studied by nano-SIMS and atom probe tomography
G Da Rosa, P Maugis, A Portavoce, J Drillet, N Valle, E Lentzen, ...
Acta Materialia 182, 226-234, 2020
622020
Three-dimensional composition mapping of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si
D Mangelinck, K Hoummada, A Portavoce, C Perrin, R Daineche, ...
Scripta Materialia 62 (8), 568-571, 2010
622010
Ge dots self-assembling: Surfactant mediated growth of Ge on SiGe (118) stress-induced kinetic instabilities
I Berbezier, A Ronda, A Portavoce, N Motta
Applied Physics Letters 83 (23), 4833-4835, 2003
612003
Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation
A Portavoce, R Hull, MC Reuter, FM Ross
Physical Review B—Condensed Matter and Materials Physics 76 (23), 235301, 2007
512007
Morphological evolution of SiGe layers
I Berbezier, A Ronda, F Volpi, A Portavoce
Surface science 531 (3), 231-243, 2003
452003
Tungsten diffusion in silicon
A De Luca, A Portavoce, M Texier, C Grosjean, N Burle, V Oison, ...
Journal of Applied Physics 115 (1), 2014
432014
Composition measurement of the Ni-silicide transient phase by atom probe tomography
K Hoummada, I Blum, D Mangelinck, A Portavoce
Applied Physics Letters 96 (26), 2010
412010
Growth kinetics of Ge islands during Ga-surfactant-mediated ultrahigh vacuum chemical vapor deposition on Si (001)
A Portavoce, M Kammler, R Hull, MC Reuter, M Copel, FM Ross
Physical Review B—Condensed Matter and Materials Physics 70 (19), 195306, 2004
392004
Sb-surfactant mediated growth of Ge nanostructures
A Portavoce, A Ronda, I Berbezier
Materials Science and Engineering: B 89 (1-3), 205-210, 2002
362002
Sb surface segregation during epitaxial growth of SiGe heterostructures: The effects of Ge composition and biaxial stress
A Portavoce, I Berbezier, P Gas, A Ronda
Physical Review B 69 (15), 155414, 2004
342004
Transition from anomalous kinetics toward Fickian diffusion for Si dissolution into amorphous Ge
Z Balogh, Z Erdélyi, DL Beke, GA Langer, A Csik, HG Boyen, U Wiedwald, ...
Applied Physics Letters 92 (14), 2008
332008
Low temperature deactivation of Ge heavily n-type doped by ion implantation and laser thermal annealing
R Milazzo, G Impellizzeri, D Piccinotti, D De Salvador, A Portavoce, ...
Applied Physics Letters 110 (1), 2017
322017
Sb segregation in Si and SiGe: effect on the growth of self-organised Ge dots
A Portavoce, F Volpi, A Ronda, P Gas, I Berbezier
Thin Solid Films 380 (1-2), 164-168, 2000
322000
Atom probe tomography for advanced metallization
D Mangelinck, F Panciera, K Hoummada, M El Kousseifi, C Perrin, ...
Microelectronic engineering 120, 19-33, 2014
312014
Progress in the understanding of Ni silicide formation for advanced MOS structures
D Mangelinck, K Hoummada, F Panciera, M El Kousseifi, I Blum, ...
physica status solidi (a) 211 (1), 152-165, 2014
302014
Manganese diffusion in monocrystalline germanium
A Portavoce, O Abbes, Y Rudzevich, L Chow, V Le Thanh, C Girardeaux
Scripta Materialia 67 (3), 269-272, 2012
302012
Nanometric size effect on Ge diffusion in polycrystalline Si
A Portavoce, G Chai, L Chow, J Bernardini
Journal of Applied Physics 104 (10), 2008
292008
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Articles 1–20