| Piezoelectric aluminum nitride nanoelectromechanical actuators N Sinha, GE Wabiszewski, R Mahameed, VV Felmetsger, SM Tanner, ... Applied Physics Letters 95 (5), 2009 | 198 | 2009 |
| Angle-resolved environmental X-ray photoelectron spectroscopy: A new laboratory setup for photoemission studies at pressures up to 0.4 Torr F Mangolini, J Åhlund, GE Wabiszewski, VP Adiga, P Egberts, F Streller, ... Review of Scientific Instruments 83 (9), 2012 | 57 | 2012 |
| Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide TDB Jacobs, GE Wabiszewski, AJ Goodman, RW Carpick Review of Scientific Instruments 87 (1), 2016 | 36 | 2016 |
| Tunable, source-controlled formation of platinum silicides and nanogaps from thin precursor films F Streller, GE Wabiszewski, F Mangolini, G Feng, RW Carpick Advanced Materials Interfaces 1 (3), 2014 | 30 | 2014 |
| Ultra thin AlN piezoelectric nano-actuators N Sinha, GE Wabiszewski, R Mahameed, VV Felmetsger, SM Tanner, ... TRANSDUCERS 2009-2009 International Solid-State Sensors, Actuators and …, 2009 | 24 | 2009 |
| Next-generation nanoelectromechanical switch contact materials: a low-power mechanical alternative to fully electronic field-effect transistors F Streller, GE Wabiszewski, RW Carpick IEEE Nanotechnology Magazine 9 (1), 18-24, 2015 | 16 | 2015 |
| Novel materials solutions and simulations for nanoelectromechanical switches F Streller, GE Wabiszewski, DB Durham, F Yang, J Yang, Y Qi, ... 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm), 363-369, 2015 | 11 | 2015 |
| Development and assessment of next-generation nanoelectromechanical switch contact materials F Streller, GE Wabiszewski, RW Carpick 14th IEEE International Conference on Nanotechnology, 141-145, 2014 | 11 | 2014 |
| Systems and methods for operating piezoelectric switches G Piazza, N Sinha, TS Jones, Z Guo, GE Wabiszewski, R Carpick, ... US Patent 8,552,621, 2013 | 10 | 2013 |
| Characterization of microscale wear in a polysilicon-based MEMS device using AFM and PEEM–NEXAFS spectromicroscopy DS Grierson, AR Konicek, GE Wabiszewski, AV Sumant, MP de Boer, ... Tribology letters 36, 233-238, 2009 | 10 | 2009 |
| Interrogation of single asperity electrical contacts using atomic force microscopy with application to nems logic switches GE Wabiszewski University of Pennsylvania, 2013 | 5 | 2013 |
| Needs and Opportunities for Nanotribology in MEMS and NEMS RW Carpick, GE Wabiszewski, F Streller Solid State Sensors, Actuators and Microsystems Workshop, Hilton Head Island, 2014 | 2 | 2014 |
| Angle-Resolved Environmental X-Ray Photoelectron Spectroscopy: A New Laboratory Setup for Photoemission Studies at Pressures up to 0.4 Torr GE Wabiszewski, F Mangolini, VP Adiga, J Åhlund, P Egberts, F Streller, ... | | 2012 |
| Development and characterization of platinum silicide as a tunable contact material for NEMS switches F Streller, GE Wabiszewski, G Piazza, RW Carpick ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 244, 2012 | | 2012 |
| The Earle Shobert Prize Paper Award F Streller, GE Wabiszewski, DB Durham, F Yang, J Yang, Y Qi, ... | | |
Robert W. CarpickJohn Henry Towne Professor, Department of Mechanical Engineering and Applied MechanicsVerified email at seas.upenn.edu
